Analog University®

ADC & DAC Errors

Objective: Identify ADC & DAC d.c. accuracy limitations due to full-scale, offset, and gain errors.

Description: Description of Full-Scale, Offset and Gain Errors, how they relate to each other and how and when they affect system performance.

Length: 45 minutes

Published Date: Feb 13, 08

Step(s) to complete

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3. Click the Test Yourself button to take the final test when ready:
   

About the Instructor: Nicholas "Nick" Gray is a Staff Applications Engineer with National Semiconductor's Data Conversion Products Group in Santa Clara, California, where he has been employed since 1991. He is currently working on the development of new products in the area of Analog-to-Digital Converters. A writer of many technical articles, Nick's career includes video circuit design and 19 years as an applications engineer for data conversion products. Nick holds a BSEE degree from Gonzaga University, Spokane, Washington (1965) and has done graduate work at California State University, San Jose.